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Digital Collections

Photographs

Bendix Model 923 Sample Inlet System

  • 1970s

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General view of a Bendix Corporation Model 923 Sample Inlet System designed for use with a Bendix Time-of-Flight Mass Spectrometer. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

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  • 10 in. H x 8 in. W
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  • Courtesy of Science History Institute

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  • Box 2

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Related Items

Cite as

Bendix Corporation. “Bendix Model 923 Sample Inlet System,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/rv042t370.

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