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Diagram of sample inlet systems for Bendix Mass Spectrometer

  • 1970s

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Diagram depicting several sample inlet systems, including the fast reaction pinhole inlet, molecular beam inlet, and sample inlet tube, designed for use with a Bendix Time-of-Flight Mass Spectrometer. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

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  • 8 in. H x 10 in. W
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  • Courtesy of Science History Institute

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  • Box 2

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Bendix Corporation. “Diagram of Sample Inlet Systems for Bendix Mass Spectrometer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/m326m210m.

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