Ion source for Bendix Mass Spectrometer
- Circa 1971
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Small JPG1200 x 1464px — 134 KBLarge JPG2880 x 3514px — 629 KBFull-sized JPG3588 x 4378px — 908 KBOriginal fileTIFF — 3588 x 4378px — 45.0 MBGeneral and detail views of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for qualitative and quantitative analysis.
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Cite as
Bendix Corporation. “Ion Source for Bendix Mass Spectrometer,” circa 1971. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 1. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/cf95jb61f.
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